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Physical Failure Analysis

Focused Ion Beam - Scanning Electron Microscope( FIB-SEM)


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Transmission Electron Microscope(TEM)


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Focused Ion Beam - Scanning Electron Microscope( FIB-SEM)


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FIB-SEM (Focused Ion Beam Scanning Electron Microscope) which is incorporated in a system with both electron and ion beam columns, is used as a micro- and nano-machining tool to modify or machine materials at the micro- and nanoscale. FIB can also be used to image topography and deposit material via ion beam induced deposition. Combined with various sensor, FIB can achieve various functions.

Energy Dispersive X-ray Spectroscopy (EDS) is an analytical technique used for the elemental quantitative analysis or chemical characterization of a specimen.


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Transmission Electron Microscope(TEM)


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TEM (Transmission electron microscopy) is a microscopy technique in which a beam of electron is transmitted through a specimen to form an image with high resolution and high magnification.


The Energy Dispersive X-ray Spectroscopy (EDS) in TEM is used for the elemental quantitative analysis or chemical characterization of nano-scale specimen.


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